Evaluating a Discreet Component for Reliability
Abstract
Kirk and Fred discussing a question on testing of a single transistor for reliability assurance.
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Author of Accelerated Reliability articles and Next Generation HALT and HASS, plus, co-host on Speaking of Reliability.
This author's archive lists contributions of articles and episodes.
Kirk and Fred discussing a question on testing of a single transistor for reliability assurance.
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Kirk discusses a very interesting failure mechanism in a Voltage Controlled Oscillator (VCO) design and manufacturing company he briefly worked at and what the detailed failure analysis showed.
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Kirk discusses the reason he wrote a book, co-authored with John Paschkewitz, on basic HALT and HASS methods along with new developments and opportunities to use HALT methods for digital software-hardware failure issues.
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Kirk discusses the continued reliance on the misleading approach of using reliability prediction for reliability development.
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Kirk discusses the many times his home appliances failing and doing his own failure analysis and the limitations.
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Kirk discusses his experiences in semiconductor manufacturing and systems manufacturing that led him to an understanding and agreement of the radical ideas that Gregg Hobbs was proposing with HALT and HASS methods.
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Kirk and Fred discussing a listener’s question on how to get started with HALT (Highly Accelerated Limit Test).
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Kirk and Fred discussing what engineers estimated stress and environmental use conditions and loads for long term use and reliability during new product development
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Kirk and Fred discussing the question of which common pet has more reliable behavior and how this relates to quality versus reliability
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Kirk and Fred discussing how to prevent a field problem from becoming a widely disseminated through the media
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Kirk and Fred discussing whether to design for the anticipated extreme corner case of environmental stresses that some percentage of the product may see in use.
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Kirk and Fred discussing testing and monitoring the development of reliability and sustaining reliability and when to stop product improvement using HALT methods.
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Kirk and Fred discussing the common response from design engineers when a weakness is found in HALT that is well outside the specifications
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Kirk and Fred discussing a little of the history of Kirk’s working with Dr. Gregg Hobbs, PE, the former IEEE/CPMT technical group Accelerated Stress Testing and Reliability and the future of promoting and teaching the use of HALT and HASS.
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Kirk and Fred discuss whether reliability testing is necessary or not.
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