test

A electronics test, debugging, or diagnostics method designed into the IC or circuit. The method observes the I/O buffers of a circuit or functional block and are controlled by scan cells.

The test or measurement results standard deviation obtained under intermediate precision conditions.

Related to drop testing specifications, it is the drop height with free-fall in vacuum under standard gravity from rest must fall to achieve the velocity equal to the velocity in the test specification.

A test conducted under specified conditions by or on behalf of the customer, using delivered or deliverable items, to determine whether or not the item satisfies specified requirements. Includes acceptance of first production units.

Closeness of agreement between a test result or measurement result and the true value. (Reference ISO 3534-2:2006)