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Accelerated Reliability

by Kirk Gray 4 Comments

No Evidence of Correlation: Field failures and Traditional Reliability Engineering

No Evidence of Correlation: Field failures and Traditional Reliability Engineering

Historically Reliability Engineering of Electronics has been dominated by the belief that 1) The life or percentage of complex hardware failures that occurs over time can be estimated, predicted, or modeled and 2) Reliability of electronic systems can be calculated or estimated through statistical and probabilistic methods to improve hardware reliability. The amazing thing about this is that during the many decades that reliabilityengineers have been taught this and believe that this is true, there is little if any empirical field data from the vast majority of verified failures that shows any correlation with calculated predictions of failure rates.
[Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: field failure, HALT, root cause, testing

by Fred Schenkelberg Leave a Comment

Does HALT Lead to Product Over-Design?

Does HALT Lead to Product Over-Design?

Every once in a while I see a comment that by following the HALT methodology you will “over design” a product.

Many question at what point or operational limit do you quit increasing the stress-strength margins. Those who hold this view of HALT do not understand the essence of what was Gregg Hobbs’ principles and paradigm shift. [Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: design, HALT

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Article by Kirk Gray
in the Accelerated Reliability series

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