Vendors and Reliability

Abstract

Kirk and Fred discuss the value or risks of sending failed components to the vendor for failure analysis.

Key Points

Join Kirk and Fred as they discuss the best way to get accurate failure analysis (FA) of a failed component.

Topics include:

• Component suppliers for high volume devices are typically not going to do a deep dive failure analysis for a small volume OEM, and the failure of their component may not be due to the component, but instead it could be caused by misapplication or misuse of the system (ESD, Voltage spikes, manufacturing damage)
• Kirk and Fred discuss their experiences using a failure analysis lab to discover failure mechanisms in discrete components that would likely not be found or acknowledged by the supplier if sent to them for FA.
• The best strategy for working with a manufacturer of a high-volume component to understand a failure is to first do a failure analysis independently. Then you are armed with FA data and can go to the supplier with clear evidence if the failure is due to a vendor process, or if it may be due to the system design.

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.

Speaking Of Reliability: Friends Discussing Reliability Engineering Topics | Warranty | Plant Maintenance

SOR 1075 Vendors and Reliability

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Show Notes

Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled  “Reliability Prediction – Continued Reliance on a Misleading Approach”. It is in the public domain, so please distribute freely. Attempting to predict reliability  is a misleading and costly approach to use for developing a reliable system.

You can now purchase the most recent recording of Kirk Gray’s Hobbs Engineering 8 (two 4 hour sessions) hour Webinar “Rapid and Robust Reliability Development – 2022 HALT & HASS Methodologies Online Seminar” from this link.

For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.