Considering High-Temperature Endurance Testing

Abstract

Andre and Fred discussing the common reliability test which is more than just tossing a few units into an oven.

Key Points

Join Andre and Fred as they discuss evaluating your product using high temperature to accelerate failure mechanism.

Topics include:

Temperature accelerates many failure mechanisms, not all of the same though
The duration of the test depends on the acceleration factor and how much time you have available
While a common test it does take some planning and analysis to get value from the results

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques, to field data analysis approaches.

SOR 188 Considering High Temperature Endurance TestingAndre Kleyner

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Show Notes

About Andre Kleyner

Andre Kleyner has 30 years of engineering, research, consulting, and managerial experience specializing in reliability of electronic and mechanical systems designed to operate in severe environments. He received the doctorate in Mechanical Engineering from University of Maryland, and Master of Business Administration from Ball State University. Dr. Kleyner is Global Reliability Engineering Leader with Delphi Electronics & Safety and an adjunct professor at Purdue University. He is an ASQ Fellow, a CRE, CQE, and Six Sigma Black Belt. He also holds several US and foreign patents and authored multiple professional publications including three books on the topics of reliability, statistics, warranty management, and lifecycle cost analysis. Andre Kleyner is also the editor of the Wiley book Series in Quality and Reliability Engineering published by John Wiley & Sons.

Comments

Dennis Craggs says

March 9, 2017 at 10:18 AM

There are other accelerating stresses, like current, that could be considered as additional accelerating factors to further accelerate the temperature failure rates in the Arrhenius model. Also, the SAE/ZVEI J1211 includes references to a database of electronic component failure modes/mechanisms. ZVEI was maintaining the database (really a very large Excel spreadsheet).

Overall a very good podcast.

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