Abstract

Kirk and Fred discussing the difficulty of keeping the failure data and details of past failures of products in order to make more reliable products.

Key Points

Join Kirk and Fred as they discuss lessons learned from past field failures.
Topics include:

• Re-learning  of the causes of past component failures and risks using the example of MLCC’s (Multi-layer Ceramic Capacitors)
• Many times component failures do not result in system failures
• It is difficult and rare to realize or show the benefit of HALT unless HALT can be applied to a shipping product that has a established field reliability history.

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques, to field data analysis approaches.

SOR 364 Keeping Failure Knowledge AliveKirk Gray

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Show Notes

For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.