Kirk and Fred discussing a little of the history of Kirk’s working with Dr. Gregg Hobbs, PE, the former IEEE/CPMT technical group Accelerated Stress Testing and Reliability and the future of promoting and teaching the use of HALT and HASS.
Join Kirk and Fred as they discuss the future of teaching HALT and HASS and the lack of change agents and HALT champions in the field to have designers realize that failures in HALT beyond specified operational limits is very difficult without experience in Highly Accelerated Limit Testing (a better description of HALT)
Topics include:
Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques, to field data analysis approaches.
Here is a link to Kirk’s book co-authored with John J. Paschkewitz available from Amazon “Next Generation HALT and HASS: Robust Design of Electronics and Systems”
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