Abstract
Kirk and Fred discussing a question on testing of a single transistor for reliability assurance.
Key Points
Join Kirk and Fred as they discuss a listeners testing a discreet component and the real future causes of failures in systems.
Topics include:
- Using a few samples of an inexpensive parts to test to limits (test to failure) to find the real capability and margin in the device.
- Most failures are due to mistakes in design, application, manufacturing which can result in latent defects.
- Testing a singular transistor in a system is not as efficient or comprehensive as stress testing at the system level.
Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.
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Show Notes
Here is a link to Kirk’s book co-authored with John J. Paschkewitz available from Amazon “Next Generation HALT and HASS: Robust Design of Electronics and Systems”
Here is the link to the US ARMY/CALCE PAPER presented at the 2013 RAMS conference event mentioned in this podcast– “Reliability Prediction – A Continued Reliance on a Misleading Approach” . This is a government document that is in the public domain and should be distributed a read by any engineer that believes failure prediction methodology is useful or beneficial during product development.
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